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Analytical Services

...for Microelectronics Failures

Hi / Lo Mag Optical Microscopy

The ultimate goal of any failure analysis flow is a detailed image of the fail mechanism. With the range of optical microscopy tools at Sage Analytical Laboratories we are able to provide high resolution captures of fail mechanisms ranging from high level package damage down through metal level anomalies.

Using Leitz and Olympus high and low magnification microscopes and capture systems, we can provide high quality inspection and imaging of devices in short order.

Going beyond final captures and results, these high resolution tools help our staff with interim inspection and documentation along the analysis path. Crisp images of the flow allows for detailed review and correlation with fault isolation techniques, giving a streamlined overview of how the final results were obtained.