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Analytical Services

...for Microelectronics Failures

LEM / EMMI / Photon Emission (PEM)

With the subtle nature of some of today’s complex failures, advanced isolation techniques are critical in determining the best place to inspect for root cause of failure.

Sage Analytical Laboratories Photon Emission solution is the answer.

Photon emission is the leading non-invasive technique used in identifying and pinpointing device level issues, as well as higher level gross fails.

Examples of failures that may be detected or isolated include:

    • Devices with shifted characteristics
    • Devices with improper junctions
    • Circuits that are operational when they should not be
    • Circuits that are not operational when they are expected to be
    • Over-current damage sites
    • Leakage currents
    • Latch-up

Photon emission microscopy works on the principle of mapping active devices. In this case, active is defined as a region where carriers (electrons, holes) are actively recombining in silicon.

When carriers recombine, they emit light (a quantized photon) that can be overlain on an optical capture of the die. Not only does this technique measure location, but a relative magnitude of emission may be interpolated from the results. This allows for in-depth interpretation of operation.