(858) 255-8587

Analytical Services

...for Microelectronics Failures

FE-SEM Analysis

Our Field Emission Scanning Electron Microscope (FE-SEM) will provide your organization with excellent images.

Combined with its EDAX detector, we can also obtain elemental composition along with multi-element dot mapping of the region of interest.

These tools in the hands of highly qualified and experienced Sage analysts will help you get to the root cause of failures quickly.