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Analytical Services

...for Microelectronics Failures

Precise Sub-Micron Cross-Sectioning

Whether you need to view an entire row of flip-chip bumps, view one specific via in die, or want to understand your process architecture, Sage can allow you to do so.

Through mechanical means or with a Dual-Beam Focused Ion Beam (FIB), we can cross-section your device and get you the image you need.