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Analytical Services

...for Microelectronics Failures

EDS Analysis

We can provide material characterization through our EDAX Energy Dispersive Spectroscopy (EDS) detector located within a Scanning Electron Microscope (SEM).

Dot maps, which provide a visual method of summarizing elements contained within the field of view, along with spectra at point locations can be generated in order to provide a thorough elemental understanding of the materials contained within your process.